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Get Advances in X-Ray Analysis: Volume 32 PDF

By John V. Gilfrich (auth.), Charles S. Barrett, John V. Gilfrich, Ron Jenkins, Ting C. Huang, Paul K. Predecki (eds.)

ISBN-10: 1475791100

ISBN-13: 9781475791105

ISBN-10: 1475791127

ISBN-13: 9781475791129

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Additional resources for Advances in X-Ray Analysis: Volume 32

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The dynamic accuracy, named the consolidated error, is defined as the synthetic error of dynamic preCision and homogeneity of measuring materials and is related to the quality of products against the production volume. In the practical applications shown in the next section, various error factors and their numerical values will be presented. 24 II. ON-LINE X-RAY ANALYSIS x - roy rat io method Ratio = Zn - Koe Fe - Koe Wall Primary X-roy's Zn-Koe Primary X-rays Detector Detector Fe-K"" Intensity decrease ltion of pass line variation (4) Elimination of Pass Line Variation It is necessary to provide a mechanism which eliminates the variation of X-ray intensity generated from a running sample.

J. Hemion and G. E. Rhead, LEED studies of the first stages of deposition and melting of lead on low index faces of copper, Surf. Sci. 29 20-36 (1972). 14. W. Hoesler and W. Moritz, LEED analysis of a dense lead monolayer on copper (100), Surf. Sci. 175 63-77 (1986). 15. K. S. , Structure and melting of lead overlayers on copper (100), in preparation (1988); Bull. Am. Phys. Soc. 32(3) p. 452 (1987). 16. K. S. Liang, P. H. Fuoss, G. J. Hughes and P. Eisenberger, in "The Structure of Surfaces" M.

Hughes and P. Eisenberger, in "The Structure of Surfaces" M. A. Van Hove and S. Y. Tong eds. Springer-Verlag, Berlin pp. 246-250 (1985). 17. S. G. Wolf, L. Leiserowitz, M. Lahav, M. Deutsch, K. Kjaer and J. Als-Nielsen, Elucidation of the two-dimensional structure of an a-amino acid surfactant monolayer on water using synchrotron X-ray diffraction, Nature 328 63-66 (1987). 18. K. S. Liang, E. B. Sirota, K. L. D'Amico, G. J. Hughes and S. K. Sinha, Roughening transition of a stepped Cu(I13) surface: a synchrotron X-ray scattering study, Phys.

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Advances in X-Ray Analysis: Volume 32 by John V. Gilfrich (auth.), Charles S. Barrett, John V. Gilfrich, Ron Jenkins, Ting C. Huang, Paul K. Predecki (eds.)


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